@inproceedings{paulsen1994mos,
author = {Paulsen, Ron},
title = {MOS device reliability studies under LabVIEW environment},
booktitle = {1994 International Electron Devices Meeting},
year = {1994},
month = {December},
abstract = {The suitability of the LabVIEW system for a device research laboratory is evaluated. The system is applied successfully to the study of MOS device reliability with the highly repetitive measurement technique of charge pumping. Interface and near-interface oxide trap generation due to hot electron injection from a vertical field injection structure is characterized with the developed software. >},
publisher = {IEEE},
url = {http://approjects.co.za/?big=en-us/research/publication/mos-device-reliability-studies-under-labview-environment/},
pages = {221-224},
}