{"id":152078,"date":"2003-10-01T00:00:00","date_gmt":"2003-10-01T00:00:00","guid":{"rendered":"https:\/\/www.microsoft.com\/en-us\/research\/msr-research-item\/recursive-method-to-extract-rectangular-objects-from-scans\/"},"modified":"2018-10-16T20:02:42","modified_gmt":"2018-10-17T03:02:42","slug":"recursive-method-to-extract-rectangular-objects-from-scans","status":"publish","type":"msr-research-item","link":"https:\/\/www.microsoft.com\/en-us\/research\/publication\/recursive-method-to-extract-rectangular-objects-from-scans\/","title":{"rendered":"Recursive Method to Extract Rectangular Objects from Scans"},"content":{"rendered":"
In scanning photographs, receipts or other small objects users will often scan many at a time. It would be convenient to automatically detect that the scanned image consists of many small objects rather than a single large one, and segment appropriately. We present a simple, efficient and robust way of doing this.<\/p>\n","protected":false},"excerpt":{"rendered":"
In scanning photographs, receipts or other small objects users will often scan many at a time. It would be convenient to automatically detect that the scanned image consists of many small objects rather than a single large one, and segment appropriately. We present a simple, efficient and robust way of doing this.<\/p>\n","protected":false},"featured_media":0,"template":"","meta":{"msr-url-field":"","msr-podcast-episode":"","msrModifiedDate":"","msrModifiedDateEnabled":false,"ep_exclude_from_search":false,"_classifai_error":"","footnotes":""},"msr-content-type":[3],"msr-research-highlight":[],"research-area":[13551],"msr-publication-type":[193716],"msr-product-type":[],"msr-focus-area":[],"msr-platform":[],"msr-download-source":[],"msr-locale":[268875],"msr-post-option":[],"msr-field-of-study":[],"msr-conference":[],"msr-journal":[],"msr-impact-theme":[],"msr-pillar":[],"class_list":["post-152078","msr-research-item","type-msr-research-item","status-publish","hentry","msr-research-area-graphics-and-multimedia","msr-locale-en_us"],"msr_publishername":"Institute of Electrical and Electronics Engineers, 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