{"id":753196,"date":"2021-06-09T13:22:12","date_gmt":"2021-06-09T20:22:12","guid":{"rendered":"https:\/\/www.microsoft.com\/en-us\/research\/?post_type=msr-research-item&p=753196"},"modified":"2021-06-09T13:23:22","modified_gmt":"2021-06-09T20:23:22","slug":"on-post-selection-inference-in-a-b-testing","status":"publish","type":"msr-research-item","link":"https:\/\/www.microsoft.com\/en-us\/research\/publication\/on-post-selection-inference-in-a-b-testing\/","title":{"rendered":"On Post-selection Inference in A\/B Testing"},"content":{"rendered":"

When interpreting A\/B tests, we typically focus only on the statistically significant results and take them by face value. This practice, termed post-selection inference in the statistical literature, may negatively affect both point estimation and uncertainty quantification, and therefore hinder trustworthy decision making in A\/B testing. To address this issue, in this paper we explore two seemingly unrelated paths, one based on supervised machine learning and the other on empirical Bayes, and propose post-selection inferential approaches that combine the strengths of both. Through large-scale simulated and empirical examples, we demonstrate that our proposed methodologies stand out among other existing ones in both reducing post-selection biases and improving confidence interval coverage rates, and discuss how they can be conveniently adjusted to real-life scenarios.<\/p>\n","protected":false},"excerpt":{"rendered":"

When interpreting A\/B tests, we typically focus only on the statistically significant results and take them by face value. This practice, termed post-selection inference in the statistical literature, may negatively affect both point estimation and uncertainty quantification, and therefore hinder trustworthy decision making in A\/B testing. To address this issue, in this paper we explore […]<\/p>\n","protected":false},"featured_media":0,"template":"","meta":{"msr-url-field":"","msr-podcast-episode":"","msrModifiedDate":"","msrModifiedDateEnabled":false,"ep_exclude_from_search":false,"_classifai_error":"","msr-author-ordering":null,"msr_publishername":"","msr_publisher_other":"","msr_booktitle":"","msr_chapter":"","msr_edition":"","msr_editors":"","msr_how_published":"","msr_isbn":"","msr_issue":"","msr_journal":"","msr_number":"","msr_organization":"ACM","msr_pages_string":"","msr_page_range_start":"","msr_page_range_end":"","msr_series":"","msr_volume":"","msr_copyright":"","msr_conference_name":"ACM SIGKDD Conference on Knowledge Discovery and Data 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