{"id":862677,"date":"2022-07-15T14:19:21","date_gmt":"2022-07-15T21:19:21","guid":{"rendered":"https:\/\/www.microsoft.com\/en-us\/research\/"},"modified":"2022-07-15T14:19:21","modified_gmt":"2022-07-15T21:19:21","slug":"observation-of-near-interface-oxide-traps-with-the-charge-pumping-technique","status":"publish","type":"msr-research-item","link":"https:\/\/www.microsoft.com\/en-us\/research\/publication\/observation-of-near-interface-oxide-traps-with-the-charge-pumping-technique\/","title":{"rendered":"Observation of near-interface oxide traps with the charge-pumping technique"},"content":{"rendered":"

In studies of MOS devices with the charge pumping technique, the authors have encountered a low-frequency increase in the charge recombined per cycle, which they attribute to the charging and discharging of traps located within a tunneling distance of the Si-SiO\/sub 2\/ interface, i.e., near-interface oxide traps. MOS devices subjected to ionizing radiation as well as ultrathin tunnel oxide polysilicon-oxide-nitride-oxide-silicon (SONOS) nonvolatile memory devices possess a high density of near-interface oxide traps. When the charge recombined per cycle is examined as a function of frequency, a breakpoint is observed at a particular frequency with an inverse equivalent to a trap-to-trap tunneling time constant.<\/p>\n","protected":false},"excerpt":{"rendered":"

In studies of MOS devices with the charge pumping technique, the authors have encountered a low-frequency increase in the charge recombined per cycle, which they attribute to the charging and discharging of traps located within a tunneling distance of the Si-SiO\/sub 2\/ interface, i.e., near-interface oxide traps. MOS devices subjected to ionizing radiation as well […]<\/p>\n","protected":false},"featured_media":0,"template":"","meta":{"msr-url-field":"","msr-podcast-episode":"","msrModifiedDate":"","msrModifiedDateEnabled":false,"ep_exclude_from_search":false,"footnotes":""},"msr-content-type":[3],"msr-research-highlight":[],"research-area":[13552],"msr-publication-type":[193715],"msr-product-type":[],"msr-focus-area":[],"msr-platform":[],"msr-download-source":[],"msr-locale":[268875],"msr-field-of-study":[265035,265047,265044,256702,247912,251830,249298,265023,249754,265017,265041],"msr-conference":[],"msr-journal":[265050],"msr-impact-theme":[],"msr-pillar":[],"class_list":["post-862677","msr-research-item","type-msr-research-item","status-publish","hentry","msr-research-area-hardware-devices","msr-locale-en_us","msr-field-of-study-analytical-chemistry","msr-field-of-study-charge-physics","msr-field-of-study-charge-pumping","msr-field-of-study-interface-computing","msr-field-of-study-materials-science","msr-field-of-study-non-volatile-memory","msr-field-of-study-optoelectronics","msr-field-of-study-oxide","msr-field-of-study-quantum-tunnelling","msr-field-of-study-tunnel-effect","msr-field-of-study-tunneling-time"],"msr_publishername":"","msr_edition":"","msr_affiliation":"","msr_published_date":"1992-11-30","msr_host":"","msr_duration":"","msr_version":"","msr_speaker":"","msr_other_contributors":"","msr_booktitle":"","msr_pages_string":"","msr_chapter":"","msr_isbn":"","msr_journal":"","msr_volume":"13","msr_number":"","msr_editors":"","msr_series":"","msr_issue":"12","msr_organization":"","msr_how_published":"","msr_notes":"","msr_highlight_text":"","msr_release_tracker_id":"","msr_original_fields_of_study":"","msr_download_urls":"","msr_external_url":"","msr_secondary_video_url":"","msr_longbiography":"","msr_microsoftintellectualproperty":0,"msr_main_download":"","msr_publicationurl":"","msr_doi":"","msr_publication_uploader":[{"type":"doi","viewUrl":"false","id":"false","title":"10.1109\/55.192866","label_id":"243106","label":0},{"type":"url","viewUrl":"false","id":"false","title":"https:\/\/ieeexplore.ieee.org\/document\/192866\/","label_id":"243109","label":0},{"type":"url","viewUrl":"false","id":"false","title":"https:\/\/ui.adsabs.harvard.edu\/abs\/1992IEDL...13..627P\/abstract","label_id":"243109","label":0}],"msr_related_uploader":"","msr_attachments":[],"msr-author-ordering":[{"type":"user_nicename","value":"Ron Paulsen","user_id":33450,"rest_url":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/microsoft-research\/v1\/researchers?person=Ron Paulsen"}],"msr_impact_theme":[],"msr_research_lab":[],"msr_event":[],"msr_group":[],"msr_project":[],"publication":[],"video":[],"download":[],"msr_publication_type":"article","_links":{"self":[{"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-research-item\/862677"}],"collection":[{"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-research-item"}],"about":[{"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/types\/msr-research-item"}],"version-history":[{"count":1,"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-research-item\/862677\/revisions"}],"predecessor-version":[{"id":862686,"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-research-item\/862677\/revisions\/862686"}],"wp:attachment":[{"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/media?parent=862677"}],"wp:term":[{"taxonomy":"msr-content-type","embeddable":true,"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-content-type?post=862677"},{"taxonomy":"msr-research-highlight","embeddable":true,"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-research-highlight?post=862677"},{"taxonomy":"msr-research-area","embeddable":true,"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/research-area?post=862677"},{"taxonomy":"msr-publication-type","embeddable":true,"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-publication-type?post=862677"},{"taxonomy":"msr-product-type","embeddable":true,"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-product-type?post=862677"},{"taxonomy":"msr-focus-area","embeddable":true,"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-focus-area?post=862677"},{"taxonomy":"msr-platform","embeddable":true,"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-platform?post=862677"},{"taxonomy":"msr-download-source","embeddable":true,"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-download-source?post=862677"},{"taxonomy":"msr-locale","embeddable":true,"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-locale?post=862677"},{"taxonomy":"msr-field-of-study","embeddable":true,"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-field-of-study?post=862677"},{"taxonomy":"msr-conference","embeddable":true,"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-conference?post=862677"},{"taxonomy":"msr-journal","embeddable":true,"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-journal?post=862677"},{"taxonomy":"msr-impact-theme","embeddable":true,"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-impact-theme?post=862677"},{"taxonomy":"msr-pillar","embeddable":true,"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-pillar?post=862677"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}